| 000 | 01797nam a2200325 a 4500 | ||
|---|---|---|---|
| 999 |
_c13468 _d13468 |
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| 001 | 000013543 | ||
| 003 | CO-BrAUC | ||
| 005 | 20180117090124.0 | ||
| 008 | 101209s2008 xxuadeogrn 001 0 eng d | ||
| 020 |
_a0131860062 _c(pasta dura) |
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| 020 |
_a9780131860063 _c(pasta dura) |
||
| 040 |
_aCO-BrUAC _cCO-BrUAC |
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| 041 | 0 | _aeng | |
| 082 | 0 | 4 |
_a621.3822 _bL416 _222 ed. |
| 100 | 1 |
_aLawday, Geoff _d1946- _95978 |
|
| 245 | 1 | 2 |
_aA signal integrity engineer's companion : _breal-time test and measurement and design simulation / _cGeoff Lawday, David Ireland, and Greg Edlund. |
| 260 |
_aNew Jersey : _bPrentice Hall, _c2008. |
||
| 300 |
_a460 p. : _bil., grafs., diagrs., fots. byn., ejems., ejercicios, etc. |
||
| 490 | 0 | _aPrentice Hall modern semiconductor design series | |
| 500 | _aIncluye índice. | ||
| 505 | 0 |
_tForeword -- _tPreface -- _tAcknowledgments -- _tAbout the authors -- _gCap. _g1. _tIntroduction: an engineer's companion -- _g2. _tChip-to-chip timing and simulation -- _g3. _tSignal path analysis as an aid to signal integrity -- _g4. _tDDR2 case study -- Real-time measurements : probing -- _g5. _tReal-Time measurements: Probing -- _g6. _tTesting and debugging : oscilloscopes and logic analysers -- _g7. _tReplicating real-world signals with signal sources -- _g8. _tSignal analysis and compliance -- _g9. _tPCI express case study -- _g10. _tThe wireless signal -- _tIndex. |
|
| 544 | 1 | _aDisponible en la Colección General. | |
| 650 | 1 | 4 |
_aProcesamiento de Señales _xMétodos Simulación _95979 |
| 650 | 1 | 4 |
_aCircuitos de Conmutación _xFiabilidad _95980 |
| 650 | 1 | 4 |
_aOsciladores Eléctricos _xPruebas _95981 |
| 650 | 1 | 4 |
_aLa Integridad de la Señal (Electricidad) _95982 |
| 700 | 1 |
_aIreland, David, _d1957- _95983 |
|
| 700 | 1 |
_aEdlund, Greg _95984 |
|
| 830 | 0 |
_aPrentice Hall modern semiconductor design series _pPrentice Hall Signal Integrity Library _95985 |
|
| 942 |
_c05 _2ddc _e21 edición _h621.3822 L416 |
||